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Nissho
Light Section Measuring Microscopes |
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Nissho Light Section
Measuring Microscopes detect depths and heights with a non-contact optical method.
They detect the unevenness of surfaces without touching them using light rays, and are
ideally suited for measurements in the range of 5 microns to 50 millimeters. |
- Projection slit light, reference slit light,
and incident light are changed from tungsten lamp to durable halogen light
source to ensure optimum illumination on the object surface for
fatigue-free, precise measuring work.
- The viewfield of object measuring surface covered by
halogen light is widened and precision measuring work is possible by non-technical people
without any special training.
- Projection slit, vertical illumination and standard
slit illumination are changed to the combination of halogen lamp and fiber optic guide.
- The improvement in illumination and area create a
fatigue-free measuring environment.
- A large specimen table for large-size objects can be
installed.
SPECIFICATIONS:
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Optical systems |
Erect image, 10X eyepiece 45° inclination (monocular or
binocular) |
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Total magnification |
100X Objective lens 10X as standard (5X, 15X & 20X as
option) |
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Standard slit |
Two parallel lines as standard (optional centerless cross) |
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Projection slit |
10 Micron (darkfield) as standard. Half-mirror 10
micron type as option. Also optionally: 3 Micron (darkfield), 30 micron
(darkfield), and 80 micron (darkfield) |
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Illumination |
Three halogen illuminators and 3 fiber optic guides |
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Focusing mechanism |
Rough movement: travel of 100mm by main column and
screw
Fine movement: travel of 2.0mm |
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XY table |
50 x 50mm travel, micrometer 10 µm reading, digital 1µm
reading |
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Size of base |
450mm x 500mm x 50mm ("SB" type base) |
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Video equipment |
Monochrome 9 inch or color 14 inch monitor |
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Z-axis measurement |
Digital 1 µm reading |
- The High Micron Scope (Type 2), 0.1 µm reading,
produces a large increase in resolution using the light section method. An
industry-leading lateral expansion ratio of 4.5X (previous industry standard 1.4X) is
achieved.
- Exceptionally suitable for non-contact measurement
of fine concave-convex surfaces.
- An anti-vibration device ensures repeatability of
reading and measuring operations and is provided as a standard specification.
STANDARD SPECIFICATIONS:
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Monocular eyepiece |
10X (field of vision = 1.5mm) |
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Objective lens |
10X (HM-90-II type) |
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Working distance |
6mm |
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Total magnification |
100X |
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Horizontal expansion ratio |
4.5X |
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Total horizontal magnification |
450X |
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Basic slit (reference slit) |
"Parallel" type |
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Projection slit |
10µ half-mirror |
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Z-axis reading on digital counter |
1~10mm |
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Minimum reading |
0.1µ |
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Video System |
High resolution camera, 14" color monitor |
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Optional accessories |
Objective lens 20X (t.h.m. = 900X, w.d. = 6mm)
Color video printer
Binocular eyepiece |
- The Micron XYZ Measuring Scope is a 3-dimensional
measuring microscope for a wide range of applications. It provides non-contact
measurement of micro depth and height, employing the light section principle. Also
vertical and longitudinal measurement and microscopic observation can be performed.
- Useful for quality control of large LCD plates.
Precise micro measurement work is possible for X, Y, and Z axes on the
"MB2" type large sliding base. Non-contact 3-dimensional measurement can
be performed without difficulty by even a non-experienced operator using the TV monitor
and XYZ axes electronic readout system.
- It offers a large specimen table for large-sized
measuring objects.
FEATURES:
- Accurate measurement performed by coinciding X, Y
and Z axes with the measuring position on the built-in reference line.
- Measured value is displayed digitally and units of 1
micron to millimeter can be used.
- Observation of the measured surface can be performed
on a video monitor.
- Coincidence of measurement and observation makes it
easy to operate and the operation extremely effective.
- Various Z axes can be measured by numerous kinds of
optical slits.
- Non-contact precision optical measuring microscopes
for micro linear dimension which provide easy and precise measurement based on
"double focusing" system.
Labtek is the authorized North American dealer for Nissho
products. For more information on a product or to
request a price quote, please contact us by phone at
877-837-7260 (toll free) or 408-871-7700, fax
408-871-7800, or email us at labtekdiv@labtek.net.
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2010, Terran Technology, Inc.; Labtek Division
Last modified:
November 06, 2012 |
